ZC Optoelectronics
AOSI-4000S Automated Lens Defect Inspection
Automated surface defect inspection for precision optical lenses.
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ZC Optoelectronics / Optical inspection
PTS-DUV-2000 / PTB-DUV-2000 Deep-UV Absorption Measurement
Deep-ultraviolet optical absorption measurement for precision optical materials.
Configuration & availability confirmed on enquiry
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Product information
Reference specifications.
Specifications are reference information; available configurations, performance and lead time are confirmed in your quotation. Manufacturer reference information; supply scope and configuration confirmed on enquiry.
| Highest absorption sensitivity | ≤0.1 ppm |
|---|---|
| Wavelength | 266 nm or custom deep-UV wavelength |
| Highest scanning spatial resolution | ≤1 µm |
Reference information: 2026-03. Final specifications are confirmed in the quotation. Ask a technical question ↗
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