ZC Optoelectronics
AOSI-4000S Automated Lens Defect Inspection
Automated surface defect inspection for precision optical lenses.
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ZC Optoelectronics / Optical inspection
SSDI-2000 Subsurface Defect Inspection
Surface and subsurface defect inspection for optical materials.
Configuration & availability confirmed on enquiry
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Product information
Reference specifications.
Specifications are reference information; available configurations, performance and lead time are confirmed in your quotation. Manufacturer reference information; supply scope and configuration confirmed on enquiry.
| Sensitivity | ≤200 nm |
|---|---|
| Lateral / vertical resolution | ≤300 nm / ≤1 µm |
| Maximum sample size | 100 × 100 mm or custom |
Reference information: 2026-03. Final specifications are confirmed in the quotation. Ask a technical question ↗
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