AMIES
AMIES FEOL Laser Annealing
FEOL Laser Annealing for semiconductor and advanced packaging applications.
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AMIES Overlay Metrology
Overlay Metrology for semiconductor and advanced packaging applications.
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Reference specifications.
Specifications are reference information; available configurations, performance and lead time are confirmed in your quotation. Manufacturer reference information; supply scope and configuration confirmed on enquiry.
| Stated measurement uncertainty | 0.25 nm |
|---|
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